000 00367nam a22001337a 4500
003 NG-AbAUS
008 160908b xxu||||| |||| 00| 0 eng d
082 _a620.1 N87
100 _a Noyan I C, Cohen J B
_91069
245 _aResidual stress. Measurement by diffraction and interpretation
260 _a1987
_bSpringer-Verlag
_c1986
300 _a276
942 _2ddc
_cBK
999 _c8024
_d8024