000 01463cam a22003974a 4500
999 _c3980
_d3980
001 14096199
003 NG-AbAUS
005 20230307093523.0
008 050902s2007 nyua b 001 0 eng c
010 _a 2005933265
015 _aGBA631488
_2bnb
016 7 _a013426036
_2Uk
020 _a9780387292601 (hbk.)
020 _a0387292608 (hbk.)
020 _a0387292616 (ebook)
020 _a9780387292618 (ebook)
035 _a(OCoLC)ocn124465046
040 _aUKM
_cUKM
_dIXA
_dYDXCP
_dCOO
_dDLC
042 _apcc
050 0 0 _aQC176.83
_b.A44 2006
082 0 0 _a621.3815/2
_222
100 1 _aAlford, Terry L.
_9511
245 1 0 _aFundamentals of nanoscale film analysis /
_cTerry L. Alford, Leonard C. Feldman and James W. Mayer.
260 _aNew York, N.Y. ;
_aLondon :
_bSpringer,
_cc2007.
300 _axiv, 336 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aThin films.
_9512
650 0 _aNanostructured materials.
_9513
700 1 _aFeldman, Leonard C.
_9514
700 1 _aMayer, James W.,
_d1930-
_9515
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/fy0713/2005933265.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0824/2005933265-d.html
906 _a7
_bcbc
_cpccadap
_d2
_encip
_f20
_gy-gencatlg
942 _2lcc
_cBK
955 _apc17 2005-09-02
_ajp00 2007-05-03
_ajp02 2007-06-21 z-processor
_ijx85 2007-07-11
_aaa23 2007-08-30