<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[AUST Library OPAC Search for 'an:676']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?q=ccl=an%3A676&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=an%3A676&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'an:676' at AUST Library OPAC]]> </description> <opensearch:totalResults>4</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=an%3A676&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dan%253A676" startPage="" /> <item> <title> Outliers in statistical data / </title> <dc:identifier>ISBN:0471995991</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=3504</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Barnett, Vic..<br /> Chichester ; | New York : Wiley, 1978 .<br /> xi, 365 p. ; , Includes index. 24 cm..<br /> 0471995991 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=3504">Place hold on <em>Outliers in statistical data /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=3504</guid> </item> <item> <title> Physica B Condensed Matter:Proceedings Of The 24th International Conference On Defects In Semiconductors </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=6455</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By De Boer,F.R. .<br /> New York Elsevier 2007 .<br /> 705 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=6455">Place hold on <em>Physica B Condensed Matter:Proceedings Of The 24th International Conference On Defects In Semiconductors</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=6455</guid> </item> <item> <title> Outliers in statistical data / </title> <dc:identifier>ISBN:0471995991</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=7711</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Barnett, Vic..<br /> Chichester ; | New York : Wiley, 1978 .<br /> xi, 365 p. ; , Includes index. 24 cm..<br /> 0471995991 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=7711">Place hold on <em>Outliers in statistical data /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=7711</guid> </item> <item> <title> Entrepreneurship </title> <dc:identifier>ISBN:9781635496628</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=8404</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Hugh Melville.<br /> New York 2018 .<br /> p. cm. 9781635496628 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=8404">Place hold on <em>Entrepreneurship</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=8404</guid> </item> </channel> </rss>
