Alford, Terry L. <br/><br/>
Fundamentals of nanoscale film analysis / 
Terry L. Alford, Leonard C. Feldman and James W. Mayer. 
 - New York, N.Y. ;  London :  Springer,  c2007. 
 - xiv, 336 p. :  ill. ;  25 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (ebook) 9780387292618 (ebook) 
<br/><br/><label>LCCN: </label>2005933265 
<br/><br/><label>Nat. Bib. No.: </label>GBA631488  bnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>013426036  Uk 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.<br/>Nanostructured materials.
<br/><br/><label>LC Class. No.: </label>QC176.83  / .A44 2006 
<br/><br/><label>Dewey Class. No.: </label>621.3815/2