Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Contributor(s): Material type: TextPublication details: New York, N.Y. ; London : Springer, c2007.Description: xiv, 336 p. : ill. ; 25 cmISBN:
  • 9780387292601 (hbk.)
  • 0387292608 (hbk.)
  • 0387292616 (ebook)
  • 9780387292618 (ebook)
Subject(s): DDC classification:
  • 621.3815/2 22
LOC classification:
  • QC176.83 .A44 2006
Online resources:
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Includes bibliographical references and index.

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