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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Alford, Terry L.
Contributor(s): Feldman, Leonard C | Mayer, James W, 1930-.
Material type: TextTextPublisher: New York, N.Y. ; London : Springer, c2007Description: xiv, 336 p. : ill. ; 25 cm.ISBN: 9780387292601 (hbk.); 0387292608 (hbk.); 0387292616 (ebook); 9780387292618 (ebook).Subject(s): Thin films | Nanostructured materialsDDC classification: 621.3815/2 Online resources: Table of contents only | Publisher description
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Item type Current location Call number Copy number Status Date due Barcode
Books Books African Development Bank Library (AfDBL)
General Stacks
QC176.83 .A442006 (Browse shelf) 1 Available 3409
Books Books African Development Bank Library (AfDBL)
General Stacks
QC176.83 .A442006 (Browse shelf) 2 Available 3410
Browsing African Development Bank Library (AfDBL) Shelves , Shelving location: General Stacks Close shelf browser
QC174. 12 .L44 2006 Applied quantum mechanics / QC176 .K38 2003 Atomic and electronic structure of solids / QC176 .8. N35 B56 2010 Introduction to nanoscience and nanotechnology / QC176.83 .A442006 Fundamentals of nanoscale film analysis / QC176.83 .A442006 Fundamentals of nanoscale film analysis / QC753.2 .C84 2014 Introduction to magnetic materials / QD116.157 147 2018 Impendence Spectroscopy

Includes bibliographical references and index.

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