Fundamentals of nanoscale film analysis /

Alford, Terry L.

Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. - New York, N.Y. ; London : Springer, c2007. - xiv, 336 p. : ill. ; 25 cm.

Includes bibliographical references and index.

9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (ebook) 9780387292618 (ebook)

2005933265

GBA631488 bnb

013426036 Uk


Thin films.
Nanostructured materials.

QC176.83 / .A44 2006

621.3815/2